Beilstein J. Nanotechnol.2018,9, 1809–1819, doi:10.3762/bjnano.9.172
mode; AMoffresonance; AM second eigenmode; cross section; crosstalk; field effect transistor; FM-KPFM; frequency modulation heterodyne; frequency modulation sideband; quantitative Kelvin probe force microscopy; solar cells; Introduction
In this study, we compare the most commonly used amplitude
measurement obtained with AM-KPFM. This matches the expectation since this method utilizes the resonance enhancement. AMoffresonance captured 82% of the potential difference, while AM lift mode only captured 57% of the potential difference. The huge deviation of AM lift mode could be caused by averaging
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Figure 1:
CPD line profiles of two KPFM experiments on the same cross section of a mesoscopic perovskite sola...